Methods and test platforms for developing an application-specific integrated circuit

摘要

Methods and test platforms for developing an application-specific integrated circuit incorporating, on the same chip, a signal processor core, RAM memory and ROM memory intended to receive a management program and processing program, and input-output management peripherals specific to the application. The signal processor, RAM memory and ROM memory correspond respectively to existing separate IC components. The processing program is developed and tested on a test platform including at least these separate IC components together with a core-emulation integrated circuit, which includes the signal processor core in a minimal configuration. An interface program and diagnostic interface logic allows the platform to be controlled from a microcomputer, which can thereby implement automatic chaining of tests.