发明名称 |
Non-overlapped scanning for a liquid crystal display |
摘要 |
This invention provides a method for scanning a thin film transistor liquid crystal display which eliminates the undesirable brightness fluctuations in the display due to parasitic capacitance. When conventional scanning methods are used in thin film transistor liquid crystal displays parasitic capacitance between the gate of the thin film transistors and the pixels causes fluctuations in brightness of the pixels. This method scans only one row of the display at a time and the brightness fluctuations of the pixels are eliminated.
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申请公布号 |
US5710571(A) |
申请公布日期 |
1998.01.20 |
申请号 |
US19950557653 |
申请日期 |
1995.11.13 |
申请人 |
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE |
发明人 |
KUO, FANG-CHIEN |
分类号 |
G02F1/133;G09G3/36;(IPC1-7):G09G3/36 |
主分类号 |
G02F1/133 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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