发明名称 NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To improve disturb/retention characteristics by providing a memory transistor in which an amount of charges changes in accordance with an applied voltage to a word line and a bit line connected thereto, resulting in a change in a threshold voltage in accordance with the change in the amount of charges. SOLUTION: A multi-value data, ternary or higher data is recorded in a single memory transistor in accordance with a threshold voltage of the memory transistor. Upon read-out, data based on a word line voltage and an mount of accumulated charges, set in accordance with the threshold voltage, is output to a bit line. Two-bit data to be recorded in the single memory transistor is represented as [D2, D1], which can take either of four states: [1, 1], [0, 1], [1, 0], and [0, 0]. Two of the threshold voltages Vth are provided on the positive side, while two of them are provided in the negative side, resulting in a wide distribution range of the threshold voltages and wide data intervals. Thus, a writing control is made to be easier.</p>
申请公布号 JPH1011981(A) 申请公布日期 1998.01.16
申请号 JP19960158548 申请日期 1996.06.19
申请人 SONY CORP 发明人 NOBUKATA HIROMI
分类号 G11C17/00;G11C11/56;G11C16/02;G11C16/04;(IPC1-7):G11C16/04;G11C16/06 主分类号 G11C17/00
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