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发明名称
SAMPLE-INSPECTION METHOD, SAMPLE-INSPECTION SYSTEM, AND MEMORY MEDIUM
摘要
申请公布号
JPH1010133(A)
申请公布日期
1998.01.16
申请号
JP19960167193
申请日期
1996.06.27
申请人
KDK CORP
发明人
TANAKA MASATO
分类号
G01N35/00;(IPC1-7):G01N35/00
主分类号
G01N35/00
代理机构
代理人
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