发明名称 DEFECT INSPECTING METHOD AND ITS DEVICE
摘要 PROBLEM TO BE SOLVED: To detect an defect in an object to be inspected in a short time. SOLUTION: At the time of coming to the prescribed position of a line sensor camera 3, a sheet 6 is converted to picture data by a picture input part 22. When a filter part 23 filters this picture data to emphasize the defect, a defect data counting part 25 counts emphasized defect data positioned in a prescribed area set to be the inspecting window Wi of an inspecting area deciding processing part 27 when it is positioned. Then when each counted value is not less than a threshold value, a defect judging processing part 28 recognizes it as a defect to affect poststages and gives information on the defect with the name of an inspecting area to outside.
申请公布号 JPH1011579(A) 申请公布日期 1998.01.16
申请号 JP19960167486 申请日期 1996.06.27
申请人 TOSHIBA ENG CO LTD 发明人 ARAI NORIYUKI;SUGIYAMA NORIYOSHI
分类号 B65H43/04;G06T1/00;G06T7/00;H04N7/18 主分类号 B65H43/04
代理机构 代理人
主权项
地址