发明名称 HALFTONE TYPE PHASE SHIFT MASK AND ITS PRODUCTION
摘要 PROBLEM TO BE SOLVED: To provide a halftone type phase shift mask of a flush type with which stable optical characteristics and pattern shapes are easily obtainable and a process for producing the same. SOLUTION: Resist patterns are formed on a transparent substrate 1 of the halftone type phase shift mask which is formed with recessed parts 3 on the transparent substrate 1 and is provided with translucent layers 4 in these recessed parts 3. The recessed parts 3 are formed by etching the transparent substrate 1 with these resist patterns as a mask. Next, a translucent layer 4 of a desired thickness is deposited over the entire surface of the transparent substrate 1 formed with the resist patterns and the recessed parts 3. The resift patterns and the translucent layers 4 on the resists are removed to form the translucent layers 4 only in the recessed parts 3.
申请公布号 JPH1010699(A) 申请公布日期 1998.01.16
申请号 JP19960160137 申请日期 1996.06.20
申请人 TOPPAN PRINTING CO LTD 发明人 OKUBO KINJI;MATSUO TADASHI
分类号 G03F1/32;G03F1/68;H01L21/027 主分类号 G03F1/32
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