发明名称 |
HALFTONE TYPE PHASE SHIFT MASK AND ITS PRODUCTION |
摘要 |
PROBLEM TO BE SOLVED: To provide a halftone type phase shift mask of a flush type with which stable optical characteristics and pattern shapes are easily obtainable and a process for producing the same. SOLUTION: Resist patterns are formed on a transparent substrate 1 of the halftone type phase shift mask which is formed with recessed parts 3 on the transparent substrate 1 and is provided with translucent layers 4 in these recessed parts 3. The recessed parts 3 are formed by etching the transparent substrate 1 with these resist patterns as a mask. Next, a translucent layer 4 of a desired thickness is deposited over the entire surface of the transparent substrate 1 formed with the resist patterns and the recessed parts 3. The resift patterns and the translucent layers 4 on the resists are removed to form the translucent layers 4 only in the recessed parts 3. |
申请公布号 |
JPH1010699(A) |
申请公布日期 |
1998.01.16 |
申请号 |
JP19960160137 |
申请日期 |
1996.06.20 |
申请人 |
TOPPAN PRINTING CO LTD |
发明人 |
OKUBO KINJI;MATSUO TADASHI |
分类号 |
G03F1/32;G03F1/68;H01L21/027 |
主分类号 |
G03F1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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