发明名称 METHOD AND DEVICE FOR OF DETERMINING REFRACTIVE INDEX AND DOUBLE REFRACTIVE INDEX BY INTERFERENCE SPECIAL MEASUREMENT, AND DETERMINING INFORMATION MEDIUM FOR THE DETERMINATION
摘要 PROBLEM TO BE SOLVED: To precisely determine the refractive index of a material by measuring the interference spectra of a plurality of samples, and determining the relation between wavelength and refractive index on the basis of them. SOLUTION: Two liquid crystals differed in cell thickness are arranged between two polarizers having mutually vertical polarizing directions, and respective interference spectra are provided in visual light area by interference method. The double refractive indexΔn in each-peak of each interference spectrum is calculated, and the wavelength dispersion curve ofΔn is determined by minimum square by use of theΔn. The same operation is performed by changing the integer of a condition expression forming the peak to determine the wavelength dispersion curve group of each liquid cell. These are superposed to extract the both where the total sum of the distance to each wavelength between the respective wavelength dispersion curves is minimized. Thus, the wavelength dispersion curve of the middle value of the both can be calculated to determineΔn. The same operation can be performed without using a polarizer to determine normal refractive index and also determine the abnormal. refractive index by use of the normal refractive index andΔn.
申请公布号 JPH1010041(A) 申请公布日期 1998.01.16
申请号 JP19960167063 申请日期 1996.06.27
申请人 NITTA HITOSHI 发明人 NITTA HITOSHI
分类号 G01J9/00;G01N21/23;G01N21/45;(IPC1-7):G01N21/23 主分类号 G01J9/00
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