发明名称 |
FABRICATION OF ELECTRODE FOR EXTERNAL CONNECTION, AND ELECTRODE FOR EXTERNAL CONNECTION AND SEMICONDUCTOR DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To inexpensively form an external connection electrode by providing a method for fabricating the external connection electrode on an active region of a semiconductor device, and providing the external connection electrode and the semiconductor device. SOLUTION: A fabrication method of an external connection electrode where an external connection electrode 11 composed of a second wiring layer 5 and an electrode formation part 6 is formed on a semiconductor device 1 having a first wiring layer 4. The method is composed of a first insulating film formation process where a first insulating film 7 is formed on the semiconductor device 1 having the first wiring layer 4 excepting a connection part 8 connected with the second wiring layer 5, a second wiring layer formation process where after at least part of a conductor film 10 connected with the first wiring layer 4 is formed on the first insulating film 7 with an electroless plating method, the conductor film 10 is patterned to hereby form the second wiring layer 5, and a second insulating film formation process where a second insulating film 13 is formed on the second wiring layer 5 excepting the electrode formation part 6.</p> |
申请公布号 |
JPH1012619(A) |
申请公布日期 |
1998.01.16 |
申请号 |
JP19960164806 |
申请日期 |
1996.06.25 |
申请人 |
FUJITSU LTD |
发明人 |
WATANABE EIJI;KASAI JUNICHI;NAGAE KENICHI;YODA HIROYUKI;FUJIMORI KUNIJI;MAKINO YUTAKA;NAKADA MINORU;MIZUKOSHI MASATAKA |
分类号 |
H01L21/60;H01L21/3205;H01L21/321;H01L23/52;(IPC1-7):H01L21/321 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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