发明名称 Etching alignment marks in silicon layer
摘要 In a method of forming alignment marks in a silicon layer using a masking layer, the etchant consists of a mixture of monoethanolamine-dimethyl-sulphoxide and water, preferably 10-75 (especially 50) vol.% of a mixture of 60-80 (especially 70) vol.% monoethanolamine and 20-40 (especially 30) vol.% dimethyl-sulphoxide in water.
申请公布号 DE19624316(A1) 申请公布日期 1998.01.08
申请号 DE1996124316 申请日期 1996.06.18
申请人 FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V., 80636 MUENCHEN, DE 发明人 KALUS, MAGDALEN, 80686 MUENCHEN, DE;BOLLMANN, DIETER, DIPL.-PHYS., 81475 MUENCHEN, DE;KLUMPP, ARMIN, DIPL.-PHYS., 80337 MUENCHEN, DE
分类号 H01L21/00;H01L23/544;(IPC1-7):C23F1/40;H01L21/461;H01L21/027;C23F1/02 主分类号 H01L21/00
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