发明名称 BASEBAND MEASUREMENT OF RF POWER AMPLIFLIER DISTORTION
摘要 An RF power amplifier distortion measurement system (100) measures amplitude and phase distortion of a microwave/RF power amplifier (10) by phase quadrature down-conversion (110, 140) of each of an RF amplifier's input signal (S) and amplified output signal (KS+E) to baseband in-phase (I) and quadrature (Q) components, and performing RF amplifier distortion measurements on these down-converted baseband I and Q signals. The derived error measurement signal is remodulated to RF by phase quadrature up-conversion circuitry (190) to produce an up-converted RF signal (E) that corresponds to the RF distortion component contained in the RF output signal (KS+E) produced by the RF power amplifier (10).
申请公布号 WO9800723(A1) 申请公布日期 1998.01.08
申请号 WO1997US11260 申请日期 1997.06.27
申请人 SPECTRIAN CORPORATION 发明人 BELCHER, DONALD, K.
分类号 G01R23/20;(IPC1-7):G01R23/20;H03G3/20 主分类号 G01R23/20
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