发明名称 Method for producing an insulation layer on a silicon wafer
摘要 A method is proposed for producing an insulation layer on a silicon wafer on which an epitaxial layer is applied according to the silicon-on-insulator arrangement comprises first developing a surface of the silicon wafer 1 with a porous structure in order to form the insulation layer. This porous structure is thermally partially oxidized and the excess oxide is subsequently stripped from the surface so that a homogeneous surface with densely arranged silicon needles results. A preferably monocrystalline silicon epitaxial layer 5 is grown on this oxidized surface comprising silicon dioxide 3 and silicon seeds, the silicon needles acting as seed cells. These silicon seeds preferably retain the mono-crystalline crystal structure of the silicon wafer. In a subsequent thermal process, the silicon oxide layer having the silicon needles is converted into a pure silicon oxide layer, so that a homogeneous oxide results. <IMAGE>
申请公布号 GB2289060(B) 申请公布日期 1998.01.07
申请号 GB19950008954 申请日期 1995.05.03
申请人 * ROBERT BOSCH GMBH 发明人 FRANZ * LAERMER;ANDREA * SCHILP
分类号 H01L21/20;H01L21/316;(IPC1-7):H01L21/762;C30B23/02;C30B25/02;C23C14/58;C23C14/02 主分类号 H01L21/20
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