发明名称 Semiconductor memory device having a redundant memory cell
摘要 NMOS transistors are arranged between bit lines included in a memory cell array and a node supplied with a power supply potential. The NMOS transistor corresponding to a defective column to be replaced with a redundant memory cell column is turned of in a standby mode. In the standby mode, therefore, it is possible to reduce a current flowing from a power supply for a power supply potential to a word line at a ground potential through the NMOS transistor, the bit line and a short-circuited portion between the bit line and the word line.
申请公布号 US5706231(A) 申请公布日期 1998.01.06
申请号 US19960768088 申请日期 1996.12.16
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KOKUBO, NOBUYUKI
分类号 G11C11/413;G11C29/00;G11C29/04;(IPC1-7):G11C7/00 主分类号 G11C11/413
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