SELECTING METHOD FOR OUTPUT MODE OF MERGED DATA OF SEMICONDUCTOR MEMORY DEVICE

摘要

PROBLEM TO BE SOLVED: To obtain different patterns of data bus lines from each other by outputting the same number of data input signals as outputs of data input buffers at the normal operating time, unifying the outputs of the data input buffers at the test operating time and outputting a data input signal. SOLUTION: At the normal operating time, outputs of four data input buffers 3, 5, 7 and 9 are inputted through their individual data input bus lines. At the time of a merged output test, the output of one data input buffer on a data bus DI0 is inputted to the remaining data buses DI1, DI2 and DI3. Address buffer outputs MA0-MA2 at the time of a merged output test are the same as the outputs at the normal operating time, and data inputted to the data input buses DI1-DI3 tied up by the address state are different from one another.