发明名称 |
Data output buffer circuit of semiconductor memory device |
摘要 |
A voltage detection unit between a data output buffer terminal and the gate a transistor which is used to dissipate a high level voltage on the internal data line. The detection unit thus prevents an undesired electrical path from existing in the data output buffer circuit. In one embodiment, the detection unit consists of an NMOS and PMOS transistor connected in series and having a shared node connected to the voltage dissipating transistor. In another embodiment, there is also connected an invertor between the shared node and the gates of the NMOS and PMOS transistors.
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申请公布号 |
US5703811(A) |
申请公布日期 |
1997.12.30 |
申请号 |
US19950580546 |
申请日期 |
1995.12.29 |
申请人 |
SAMSUNG ELECTRONOCS CO., LTD. |
发明人 |
YOO, SEUNG-MOON;YOO, JEI-HWON |
分类号 |
G11C11/417;G11C7/10;G11C11/409;H03K19/003;H03K19/0175;H03K19/0948;(IPC1-7):G11C13/00 |
主分类号 |
G11C11/417 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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