发明名称 Mask for transferring a pattern for use in a semiconductor device and method of manufacturing the same
摘要 A mask for transferring a pattern in which durability can be improved and a very fine circuit pattern of a light-shielding film can be formed, and a manufacturing method thereof are obtained. In the mask for transferring a pattern, a silicon monocrystalline film 2, an aluminum monocrystalline film 3 and an aluminum oxide film 4 are formed on a mask substrate 1 so as to have a prescribed pattern feature. Silicon monocrystalline film 2 and aluminum monocrystalline film 3 serve as the light-shielding film. Aluminum oxide film 4 serves as an anti reflection and protection film.
申请公布号 US5702849(A) 申请公布日期 1997.12.30
申请号 US19960721076 申请日期 1996.09.26
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION 发明人 SAKATA, HIROFUMI;NISHIOKA, TADASHI
分类号 G01Q30/12;G03F1/08;G03F1/14;H01L21/027;(IPC1-7):G03F9/00 主分类号 G01Q30/12
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