发明名称 Etching of nitride crystal
摘要 A gas-phase etchant is provided. The gas-phase etchant includes at least one halogen in gaseous form and/or at least one halogen halide in gaseous form. A Group III-nitride crystal is heated to a temperature in the range of 500-900 DEG C and is etched in a flow of the gas-phase etchant. The gas-phase etchant may additionally include hydrogen. The gas-phase etchant may alternatively be diluted with inert gas, and the Group III-nitride crystal may be etched in a flow of the gas-phase etchant diluted with the inert gas. <IMAGE>
申请公布号 EP0762486(A3) 申请公布日期 1997.12.29
申请号 EP19960305466 申请日期 1996.07.25
申请人 HEWLETT-PACKARD COMPANY 发明人 KANEKO, YAWARA;YAMADA, NORIHIDE
分类号 C23F4/00;H01L21/205;H01L21/302;H01L21/306;H01L21/3065;H01S5/00;H01S5/323 主分类号 C23F4/00
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