发明名称 NON-CONTACT INSPECTION SYSTEM
摘要 A non-contact inspection system capable of evaluating spatial form parameters of a workpiece to provide 100% inspection of parts in production. The system causes parts to be sequentially loaded onto an inclined track where they pass through a test section. The test section includes a length detection array for measuring the length of the workpiece, which includes a source generating a sheet of light oriented in the longitudinal direction of the workpiece. The profile of the parts are evaluated by one or more light sources also creating a sheet of light oriented transversed to the longitudinal axis of the parts. Single channel photodetectors are provided for each of the sources which provides an analog output of the extent to which each sheet of light is occluded by the part. These outputs are analyzed through appropriate signal processing hardware and software to generate length and profile data related to the workpiece geometry.
申请公布号 EP0695413(A4) 申请公布日期 1997.12.29
申请号 EP19940914070 申请日期 1994.04.07
申请人 MECTRON ENGINEERING COMPANY 发明人 HANNA, JAMES, LEE
分类号 G01B11/04;G01B11/24;G01B11/245;G01N21/952 主分类号 G01B11/04
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