发明名称 METAL WIRING MOLDING METHOD OF SEMICONDUCTOR DEVICE
摘要 A method for implanting impurities of an alloy for metal wires is provided to improve a property of an alloy. The method comprises the steps of: forming a contact hole by etching an insulating layer(2) deposited on a silicon substrate(1); depositing a diffusion preventing metal layer(3) on the contact hole; depositing an impurity layer(4) on the resultant structure; depositing a metal wiring alloy film(5) on the impurity layer(4); and forming an anti-reflection layer(7) on the metal wiring alloy film(5).
申请公布号 KR0126124(B1) 申请公布日期 1997.12.26
申请号 KR19920015859 申请日期 1992.09.01
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 KIM, HUN-DO;CHO, KYUNG-SOO
分类号 C23C14/58;C23C28/00;H01L21/22;H01L21/3205;H01L23/52;(IPC1-7):H01L21/22 主分类号 C23C14/58
代理机构 代理人
主权项
地址