发明名称 |
METAL WIRING MOLDING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
A method for implanting impurities of an alloy for metal wires is provided to improve a property of an alloy. The method comprises the steps of: forming a contact hole by etching an insulating layer(2) deposited on a silicon substrate(1); depositing a diffusion preventing metal layer(3) on the contact hole; depositing an impurity layer(4) on the resultant structure; depositing a metal wiring alloy film(5) on the impurity layer(4); and forming an anti-reflection layer(7) on the metal wiring alloy film(5).
|
申请公布号 |
KR0126124(B1) |
申请公布日期 |
1997.12.26 |
申请号 |
KR19920015859 |
申请日期 |
1992.09.01 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
KIM, HUN-DO;CHO, KYUNG-SOO |
分类号 |
C23C14/58;C23C28/00;H01L21/22;H01L21/3205;H01L23/52;(IPC1-7):H01L21/22 |
主分类号 |
C23C14/58 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|