| 摘要 |
<p>Only the value of the least-significant bit, or of some of the less-significant bits is used in order to test an analog-to-digital converter in an integrated circuit. The information concerning the differential and the integral non-linearity can be determined from the values of said less-significant bit. Furthermore, the functionality of the analog-to-digital converter is tested by counting the number of changes of the least-significant bit and by comparing this number with the value formed by the other bits.</p> |
