Semiconductor storage device with macro-cell with monitoring of input data

摘要

It is an object of the present invention to realize bypass of input data in a macro-cell such as a FIFO memory etc. to facilitate test and evaluation about other macro-cells. A bypass route (6) is provided between an input port (DI) and an output port (DO) in a FIFO memory (1) and a data bypassing selector (8) is further provided for selecting the bypass route (6) and a sense amplifier (7) of a read bit line (R.BL). Then, in the test mode, a first selector control signal (S) is set to an L level and a second selector control signal (+E,ovs S+EE ) of opposite phase is set to an H level. Thus, in the test mode, a data inputted from the input port (DI) is outputted from the output port (DO) by way of the bypass route (6) without via memory cells (MC1-MCX).