发明名称 Self-aligned isolated polysilicon plugged contacts
摘要 A method for preparing an SRAM or DRAM structure on a substrate with an oppositely doped well therein, a field oxide region extending above and between the well and the substrate, first and second N-MOS transistors on the silicon substrate, and a P-MOS transistor on the silicon well. The source and drain regions of each of the P-MOS transistor and the first and second N-MOS transistors each have a polysilicon plug making contact therewith. Each polysilicon plug is isolated one from another by nitride spacers, has the same doping as the region with which it makes contact, and is self-aligned to the nitride spacers lining the passage of the polysilicon plugs to their respective contacts on either the silicon substrate or the silicon well. The self-aligned nature of the polysilicon plugs is due to the nitride spacers formed by etchant selectivities and photoresist masks.
申请公布号 US5700706(A) 申请公布日期 1997.12.23
申请号 US19950572969 申请日期 1995.12.15
申请人 MICRON TECHNOLOGY, INC. 发明人 JUENGLING, WERNER
分类号 H01L21/60;H01L21/762;H01L21/8242;H01L27/105;H01L27/108;(IPC1-7):H01L21/70 主分类号 H01L21/60
代理机构 代理人
主权项
地址