发明名称 Method for manufacturing an insulating trench in an SOI substrate for smartpower technologies
摘要 A method for producing an insulating trench in an SOI substrate having integrated logic elements and high-voltage power components is provided. A trench extending down to an insulating layer is etched and covered with a doped silicon structure. Diffusion regions neighboring the trench are produced by drive-out from the doped amorphous silicon structure and an insulation structure is simultaneously produced in the trench by oxidation of the doped silicon structure.
申请公布号 US5700712(A) 申请公布日期 1997.12.23
申请号 US19950552976 申请日期 1995.11.03
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 SCHWALKE, UDO
分类号 H01L21/225;H01L21/76;H01L21/762;H01L27/12;(IPC1-7):H01L21/76 主分类号 H01L21/225
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