发明名称 SEMICONDUCTOR CRYSTAL BODY AND PRODUCTION THEREOF, SEMICONDUCTOR LASER AND FABRICATION THEREOF, SEMICONDUCTOR LIGHT RECEIVING ELEMENT AND FABRICATION THEREOF, AND FIELD EFFECT TRANSISTOR AND FABRICATION THEREOF
摘要 PROBLEM TO BE SOLVED: To diffuse impurities at high concentration into a semiconductor crystal body having a large diameter under mirror face state. SOLUTION: The method for producing a semiconductor crystal body by vapor phase epitaxial growth employs a compound containing a group III element, i.e., TMIn, and a compound containing a group V element, i.e., PH3 , as a material of semiconductor and a compound containing a group II element of Zn, i.e., DMZn, as a material of impurity diffusion species. Crystal growth temperature is set at 420 deg.C, for example, which is lower than a normal level for bringing about a mirror face state at the crystal growth interface. Subsequently, an undoped layer 12 of 2μm thick is grown on a substrate 11 of InP doped with Sn and a Zn doped layer 13 of 1μm thick is grown thereon while feeding a diffusion species Zn at a concentration of 5×10<18> cm<-3> which is higher than the saturated concentration of normal diffusion species Zn.
申请公布号 JPH09330882(A) 申请公布日期 1997.12.22
申请号 JP19960149007 申请日期 1996.06.11
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OTSUKA NOBUYUKI;KITO MASAHIRO;INABA YUICHI;ISHINO MASATO
分类号 C30B25/10;C30B29/40;H01L21/205;H01L21/22;H01L21/308;H01L21/337;H01L21/338;H01L29/06;H01L29/66;H01L29/808;H01L29/812;H01S5/00;(IPC1-7):H01L21/205;H01S3/18 主分类号 C30B25/10
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