发明名称 |
METHOD OF MANUFACTURING PHOTOMASK, METHOD OF MANUFACTURING PHASE-SHIFTING MASK, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
A photomask manufacturing method includes a step (100) of comparing the design data before a design change with those after the design change, a step (200) of finding areas in which design data are changed from the original design data, a step (300) of preparing new drawing data for the changed-data areas in accordance with the changed data, a step (400) of combining the drawing data of the changed-data areas with the already prepared drawing data of unchanged-data areas, and a step (500) of fabricating a photomask after the design change based on the combined drawing data. |
申请公布号 |
WO9748019(A1) |
申请公布日期 |
1997.12.18 |
申请号 |
WO1996JP01574 |
申请日期 |
1996.06.11 |
申请人 |
HITACHI, LTD.;TSUJIMOTO, EIJI;SATO, YASUO;SUZUKI, TOSHIO |
发明人 |
TSUJIMOTO, EIJI;SATO, YASUO;SUZUKI, TOSHIO |
分类号 |
G03F1/00 |
主分类号 |
G03F1/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|