发明名称 METHOD OF MANUFACTURING PHOTOMASK, METHOD OF MANUFACTURING PHASE-SHIFTING MASK, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A photomask manufacturing method includes a step (100) of comparing the design data before a design change with those after the design change, a step (200) of finding areas in which design data are changed from the original design data, a step (300) of preparing new drawing data for the changed-data areas in accordance with the changed data, a step (400) of combining the drawing data of the changed-data areas with the already prepared drawing data of unchanged-data areas, and a step (500) of fabricating a photomask after the design change based on the combined drawing data.
申请公布号 WO9748019(A1) 申请公布日期 1997.12.18
申请号 WO1996JP01574 申请日期 1996.06.11
申请人 HITACHI, LTD.;TSUJIMOTO, EIJI;SATO, YASUO;SUZUKI, TOSHIO 发明人 TSUJIMOTO, EIJI;SATO, YASUO;SUZUKI, TOSHIO
分类号 G03F1/00 主分类号 G03F1/00
代理机构 代理人
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