发明名称 DEVICE FOR MEASURING DEFLECTION
摘要 PROBLEM TO BE SOLVED: To relaize deflection measurement with high resolution and high accuracy by sending laser light having two frequencies to a deflection sensing head from a light source through an optical fiber and adopting the optical heterodyne interferometry which is symmetrical complementarily. SOLUTION: A light beam passing through a fiber F is collimated by a lens L, and it is sent to the following routes. A polarization beam splitter P2 divides the light into two frequency elements through polarization. A mirror reflects the beam toward a non-polarization beam splitter N, and the beam arrives at a return reflector R1 or R2. Polarization analysers A1 and A2 before optical detectors D1 and D2 are arranged orthogonally in the same manner as typical heterodyne interferometer, and they send about half of respective polarization element of incident beam. The beam has two frequency elements, and since they are in the same polarization condition, they are subject to optical interference. The inter-ferometer processes electrically two interference phases which are changed due to deflection, and the quantity to be processed thereby is the same as that of heterodyne interferometer excluding their phase difference.
申请公布号 JPH09325005(A) 申请公布日期 1997.12.16
申请号 JP19970044069 申请日期 1997.02.27
申请人 BOEING CO:THE 发明人 JIYON EI BERU;TOOMASU ESU BUREIDENBATSUCHI;BAABARA EI KAPURON;DEIBITSUDO EI RIIPU;CHIYAARUZU REI PONDO
分类号 G01B9/02;G01B11/00;G01D5/26;(IPC1-7):G01B9/02 主分类号 G01B9/02
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