| 摘要 |
<p>PROBLEM TO BE SOLVED: To enable identification of deformation mode by measuring crystal orientation of each crystal grain at a plurality of points, generating an orientation distribution graph by opening orientation changes in reference point and ambient, by generating an orientation distribution graph only for measurement points on a straight line, and examining the level of dislocation density. SOLUTION: A sample for a transmission-type electron microscope is prepared, and it is observed with the transmission-type electron microscope, for finding a sample which is not small where the thickness is large, and prepare a sample of about 3mm in diameter and about 100μm in thickness based on the found sample. The prepared sample is observed with the transmission-type electron microscope to determine the two-dimensional change in crystal orientation within one crystal grain by the measurement using Kikuchi line, is obtained. This is plotted for all measurement points to generate an orientation distribution graph, and generating an orientation distribution graph is prepared by plotting the distribution graph for only measurement points on a straight line. Further, based on the observation with the transmission-type electron microscope, the level of dislocation density is judged. By combining these three judgement materials, it is possible to determine whether the damage on examined sample is a plastic deformation, creep, creep fatigue or fatigue.</p> |
