发明名称 DETECTION CIRCUIT FOR FAILURE OF DIODE
摘要 PROBLEM TO BE SOLVED: To obtain a detection circuit by which the failure of a diode can be detected without oppressing a component mounting space by a method wherein whether heat is generated or not on the basis of a power consumption due to internal impedances of a first diode and of a second diode is detected by a first temperature sensor and a second temperature sensor and detection results of the respective temperature sensors are displayed. SOLUTION: When a first diode 13 and a second diode 14 are normal, usually a first temperature sensor 15 and a second temperature sensor 16 are operated by heat generated by the power consumption of their internal impedances after a certain time has elapsed. Then, when the first diode 13 is failed, the first temperature sensor 15 is not operated. When the second diode 14 is failed, the second temperature sensor 16 is not operated. Their results are displayed on a display part 17. Thereby, the failure of the respective diodes 13, 14 can be detected without increasing the costs of a detection circuit and without oppressing a component mounting space.
申请公布号 JPH09327120(A) 申请公布日期 1997.12.16
申请号 JP19960142723 申请日期 1996.06.05
申请人 NEC CORP 发明人 SHIINA MISAO
分类号 G01R31/26;G01R31/02;H02H5/04;H02H7/12;H02J1/10;H02J7/00;H02J9/06 主分类号 G01R31/26
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