发明名称 |
FERROELECTRIC THIN FILM DEVICE, MANUFACTURE THEREOF AND FERROELECTRIC MEMORY DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a ferroelctric thin film device, a manufacturing method thereof and a ferroelectric memory device, enabling the low temp. film forming with reduced leak current. SOLUTION: The method of manufacturing a ferroelectric thin film device having a lower electrode layer 4, the ferroelectric thin film 5 and upper electrode layer 6 successively laminated on a substrate comprises forming an oxide thin film to be the ferroelectric thin film 5 on the lower electrode layer 4 formed on the substrate by the physical or chemical vapor deposition, forming the upper electrode layer 6 on this oxide thin film, and heating it to form the ferroelectric thin film 5 in a less pressure gas atmosphere than 1atm. in a heat treating step. |
申请公布号 |
JPH09321234(A) |
申请公布日期 |
1997.12.12 |
申请号 |
JP19960145425 |
申请日期 |
1996.06.07 |
申请人 |
SHARP CORP |
发明人 |
ITO YASUYUKI;USHIKUBO MAHO;YOKOYAMA SEIICHI;MATSUNAGA HIRONORI |
分类号 |
H01L21/8247;H01L21/316;H01L21/336;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792;H01L37/02;H01L41/09;H01L41/18;H01L41/22 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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