发明名称 FERROELECTRIC THIN FILM DEVICE, MANUFACTURE THEREOF AND FERROELECTRIC MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a ferroelctric thin film device, a manufacturing method thereof and a ferroelectric memory device, enabling the low temp. film forming with reduced leak current. SOLUTION: The method of manufacturing a ferroelectric thin film device having a lower electrode layer 4, the ferroelectric thin film 5 and upper electrode layer 6 successively laminated on a substrate comprises forming an oxide thin film to be the ferroelectric thin film 5 on the lower electrode layer 4 formed on the substrate by the physical or chemical vapor deposition, forming the upper electrode layer 6 on this oxide thin film, and heating it to form the ferroelectric thin film 5 in a less pressure gas atmosphere than 1atm. in a heat treating step.
申请公布号 JPH09321234(A) 申请公布日期 1997.12.12
申请号 JP19960145425 申请日期 1996.06.07
申请人 SHARP CORP 发明人 ITO YASUYUKI;USHIKUBO MAHO;YOKOYAMA SEIICHI;MATSUNAGA HIRONORI
分类号 H01L21/8247;H01L21/316;H01L21/336;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792;H01L37/02;H01L41/09;H01L41/18;H01L41/22 主分类号 H01L21/8247
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