发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURE THEREOF |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor memory device and a manufacturing method thereof which has a charge pump circuit high a high pressure booster function, making it fine and reducing the power consumption. SOLUTION: The memory cell part of the semiconductor memory device is composed of floating gate transistors having floating gate electrodes 4 formed through a first gate insulation film 3 on a principal plane of a semiconductor substrate 1 and control gate electrodes 6 formed on the floating gate electrodes 4 through a first insulation film 5. The charge pump circuit is compose of series connected diode elements on a thick insulation film and capacitors connected to terminals of the diode elements.</p> |
申请公布号 |
JPH09321232(A) |
申请公布日期 |
1997.12.12 |
申请号 |
JP19960137221 |
申请日期 |
1996.05.30 |
申请人 |
NEC CORP |
发明人 |
ISHIGE SEIICHI |
分类号 |
G11C17/00;G11C16/04;G11C16/06;G11C16/30;H01L21/8234;H01L21/8247;H01L27/06;H01L27/10;H01L29/788;H01L29/792;H02M3/07;H03K19/096;(IPC1-7):H01L27/10;H01L21/823 |
主分类号 |
G11C17/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|