发明名称 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURE THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor memory device and a manufacturing method thereof which has a charge pump circuit high a high pressure booster function, making it fine and reducing the power consumption. SOLUTION: The memory cell part of the semiconductor memory device is composed of floating gate transistors having floating gate electrodes 4 formed through a first gate insulation film 3 on a principal plane of a semiconductor substrate 1 and control gate electrodes 6 formed on the floating gate electrodes 4 through a first insulation film 5. The charge pump circuit is compose of series connected diode elements on a thick insulation film and capacitors connected to terminals of the diode elements.</p>
申请公布号 JPH09321232(A) 申请公布日期 1997.12.12
申请号 JP19960137221 申请日期 1996.05.30
申请人 NEC CORP 发明人 ISHIGE SEIICHI
分类号 G11C17/00;G11C16/04;G11C16/06;G11C16/30;H01L21/8234;H01L21/8247;H01L27/06;H01L27/10;H01L29/788;H01L29/792;H02M3/07;H03K19/096;(IPC1-7):H01L27/10;H01L21/823 主分类号 G11C17/00
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