发明名称 FILM SURFACE MEASURING EQUIPMENT
摘要 <p>PROBLEM TO BE SOLVED: To enable continuously measuring the whole part of a film surface, and preventing a prism and a film from being damaged. SOLUTION: A film 5 is delivered to a part between two film feeding rollers 1, which stop at a specified position. A film colse contact arm 2 moves downward, and presses the film 5 against a prism 3. An infrared ray of a parallel flux from an infrared ray source is converged on a point of the prism 3. After the wavelength component corresponding to the surface characteristics of the film 5 is absorbed, the infrared ray is totally reflected, and enters again the prism 3. The infrared ray is turned into a parallel flux by a beam condenser 4, and inputted in an infrared spectral photometer or the like. When measurement is finished, the film close contact arm 2 moves upward, and releases the pressing on the film 5. The film feeding rollers 1 which have stopped rotate again, and the film 5 is sent. Hence the measurement is continuously performed.</p>
申请公布号 JPH09318527(A) 申请公布日期 1997.12.12
申请号 JP19960133839 申请日期 1996.05.28
申请人 SHIMADZU CORP 发明人 TSUCHIBUCHI TAKESHI;SUZUKI KOJI
分类号 G01N21/3559;(IPC1-7):G01N21/35 主分类号 G01N21/3559
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