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发明名称
TEST DEVICE FOR SEMICONDUCTOR MEMORY
摘要
申请公布号
JPH09320294(A)
申请公布日期
1997.12.12
申请号
JP19960135206
申请日期
1996.05.29
申请人
ADVANTEST CORP
发明人
SATOU SHINYA
分类号
G01R31/28;G01R31/3183;G11C11/401;G11C11/407;G11C29/00;G11C29/56;(IPC1-7):G11C29/00;G01R31/318
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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