发明名称 Contour measuring device for two=dimensional determination of workpiece surface contours
摘要 The device has a housing. A probe arm (8) is mounted to pivot about an axis (9). A probe body (11) can be fastened to an end of the arm (8). The arm (8) is coupled to at least one measurement convertor to convert deflection of the arm (8) into an electric signal. A loading device strikes the arm (8) with a torque which presses the probe body to the surface of the work piece. The loading arm is formed such that the force generated by it is electrically controllable. A rocker is mounted on the arm. The rocker has an outer section arranged outside the housing to hold the test arm (8). It also has a rotatable section mounted in the housing. A coupling mechanism is arranged outside the housing on the outer section of the rocker. This releasably connects the arm (8) with the rocker and defines a disconnecting point accessible from outside the housing.
申请公布号 DE19617022(C1) 申请公布日期 1997.12.11
申请号 DE19961017022 申请日期 1996.04.27
申请人 MAHR GMBH, 37073 GOETTINGEN, DE 发明人
分类号 G01B3/00;G01B5/20;H02K41/035;(IPC1-7):G01B5/20;G01B5/004;G01B5/28;G05D5/00 主分类号 G01B3/00
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