发明名称 Silicon capacitor production in silicon substrate
摘要 The invention relates to method for producing a silicium capacitor by producing hole structures (2) on a silicium substrate (1). A conductive area (3) is produced in the surface of said structures by doping, to which a dielectric layer (4) and a conducting layer (5) is applied without filling the hole structures (2). In order to compensate the mechanical stress of the silicium substrate (1) caused by the doping of the conductive area (3), a conformal auxiliary layer (6) is formed on the surface of the conducting layer (5), which is subjected to compressive mechanical tension
申请公布号 DE19701935(C1) 申请公布日期 1997.12.11
申请号 DE1997101935 申请日期 1997.01.21
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 WENDT, HERMANN, DR., 85630 GRASBRUNN, DE;WILLER, JOSEF, DR., 85521 RIEMERLING, DE;HOENLEIN, WOLFGANG, DR., 82008 UNTERHACHING, DE;LEHMANN, VOLKER, DR., 80689 MUENCHEN, DE;REISINGER, HANS, DR., 82031 GRUENWALD, DE;GRUENING, ULRIKE, DIPL.-PHYS., 80796 MUENCHEN, DE;SPITZER, ANDREAS, DR., 81739 MUENCHEN, DE;STENGL, REINHARD, DR., 86391 STADTBERGEN, DE
分类号 H01L27/04;H01L21/334;H01L21/822;H01L21/8242;H01L29/94;(IPC1-7):H01L21/824;H01G4/40 主分类号 H01L27/04
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