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发明名称
Vorrichtung und Verfahren zur Untersuchung eines Halbleiters
摘要
申请公布号
DE69030647(T2)
申请公布日期
1997.12.11
申请号
DE19906030647T
申请日期
1990.12.27
申请人
SHARP K.K., OSAKA, JP
发明人
NAKANO, AKIHIKO, NARA-SHI, NARA-KEN, JP
分类号
G01R31/302;G01R31/305;(IPC1-7):H01L23/544;G01N1/32;H01J37/20
主分类号
G01R31/302
代理机构
代理人
主权项
地址
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