发明名称 FABRICATION METHOD OF MOSFET
摘要 There is provided a method for fabricating a MOSFET having an increased effective channel length. The method includes: forming a semiconductor substrate(1) having a projected portion; depositing a gate oxide layer and a polysilicon layer(3) in the named order on the substrate(1); forming a LDD region at both side of the projected portion of the substrate(1); forming a silicide layer(7) on the polysilicon layer(3); forming a spacer(5) at side walls of the projected portion by depositing a low temperature oxide layer on the silicide layer(7) and performing an anisotropic blanket etch; removing the silicide layer and the polysilicon layer on the substrate except the projected portion and adjacent portion thereof; and forming source/drain regions in the substrate.
申请公布号 KR0125296(B1) 申请公布日期 1997.12.10
申请号 KR19930031829 申请日期 1993.12.31
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 PARK, SANG-HOON
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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