发明名称 |
FABRICATION METHOD OF MOSFET |
摘要 |
There is provided a method for fabricating a MOSFET having an increased effective channel length. The method includes: forming a semiconductor substrate(1) having a projected portion; depositing a gate oxide layer and a polysilicon layer(3) in the named order on the substrate(1); forming a LDD region at both side of the projected portion of the substrate(1); forming a silicide layer(7) on the polysilicon layer(3); forming a spacer(5) at side walls of the projected portion by depositing a low temperature oxide layer on the silicide layer(7) and performing an anisotropic blanket etch; removing the silicide layer and the polysilicon layer on the substrate except the projected portion and adjacent portion thereof; and forming source/drain regions in the substrate.
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申请公布号 |
KR0125296(B1) |
申请公布日期 |
1997.12.10 |
申请号 |
KR19930031829 |
申请日期 |
1993.12.31 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
PARK, SANG-HOON |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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