发明名称 REMOVING METHOD OF PHOTORESIST
摘要 On the occasion of implantation of high density ion on a semiconductor substrate(1) or on the oxide film(2) on the semiconductor substrate, photoresist(3) to be used as selective protective film, will be spread on them, and in order to remove only the photoresist from the area where ion will be implanted, pattern through photo exposure and development process, and implant ions such as Aa, BF2(4) etc. Then, remove photoresist(3) through the washing process, and the remaining ion oxide material by washing.
申请公布号 KR0124636(B1) 申请公布日期 1997.12.10
申请号 KR19940007740 申请日期 1994.04.13
申请人 LG SEMICONDUCTOR CO.,LTD 发明人 LEE, SANG-RAE;KWON, HYUK-JIN
分类号 H01L21/312;(IPC1-7):H01L21/312 主分类号 H01L21/312
代理机构 代理人
主权项
地址