Circuit for searching fault location in a device having a plurality of application specific integrated circuits

摘要

The present invention relates to a circuit for searching a fault location in a device having a number of ASIC's, including a first BIP(Bit Interleaved Parity) generating unit, which is coupled to the input stage of the ASIC where a fault will be detected, for calculating and outputting BIP for the specific byte, which is one of overhead bytes that were already utilized, i.e., not in use in transmission line, during a certain period; a BIP extraction unit, which is in parallel connected with the first BIP generating unit, for extracting the same byte as said specific byte from overhead bytes, which are generated and inserted in the previous-stage ASIC, in order to compare with BIP inputted into the first BIP generating unit during a certain period; a BIP comparison unit for simply comparing the result outputted from the first BIP generating unit with the result outputted from the BIP extraction unit; a BIP accumulation unit for accumulating the results outputted by the BIP comparison unit; a BIP threshold interrupt processing unit for comparing the results accumulated by the BIP accumulation unit with the threshold value which is used as the reference for generating an interrrupt, and then externally outputting the compared result; a second BIP generating unit, which is coupled to the output stage of the ASIC, for calculating and then outputting BIP for all the bytes within the transmission line(HBUS) during a certain period in order to inspect the signal of HBUS to the next-stage ASIC; and a BIP inserting unit for inserting the result generated from the second BIP generating unit into the specific byte location whithin said transmission line.