发明名称 Process of etching silicon nitride layer by using etching gas containing sulfur hexafluoride, hydrogen bromide and oxygen
摘要 A silicon nitride layer on a silicon oxide layer is selectively etched by using etching gas containing sulfur hexafluoride, hydrogen bromide and oxygen, and the hydrogen bromide is large enough in vapor pressure to maintain the composition of the etching gas without a heater.
申请公布号 US5695602(A) 申请公布日期 1997.12.09
申请号 US19960650983 申请日期 1996.05.21
申请人 NEC CORPORATION 发明人 TAKESHIRO, SHINICHI
分类号 C23F4/00;H01L21/302;H01L21/3065;H01L21/311;(IPC1-7):H01L21/00 主分类号 C23F4/00
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