| 摘要 |
A process for ascertaining the microdefect levels of an electrophotographic imaging member including establishing for a first electrophotographic imaging member, having a known differential increase in dark decay value and a measured crest value, a first reference datum for dark decay crest value at an initial applied field; establishing with the crest value a second reference datum for dark decay crest value at a final applied field; determining the differential increase in dark decay between the first reference datum and the second reference datum for the first electrophotographic imaging member; repeatedly subjecting a virgin electrophotographic imaging member, having a measured crest value, to aforesaid cycles until the amount of dark decay reaches the crest value for the virgin electrophotographic imaging which remains substantially constant; establishing with virgin electrophotographic imaging member, having a measured crest value, a third reference datum for dark decay crest value; establishing for the virgin electrophotographic imaging member a fourth reference datum for dark decay crest value; determining the differential increase in dark decay between the third reference datum and the fourth reference datum to establish a differential increase in dark decay value for the virgin electrophotographic imaging member; and comparing the differential increase in dark decay value of the virgin electrophotographic imaging member with the known differential increase in dark decay value.
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