发明名称 Method for fabricating BiCMOS device
摘要 A method for fabricating a bipolar complementary metal oxide semiconductor device, includes a first step of forming a three-layered substrate of p-/n+/n- type or n-/p+/p- type and forming p- and n-wells to be adjacent to each other to the bottom of the top layer of the three-layered substrate; a second step of isolating the p- and n-wells from each other and defining a region for a bipolar transistor on one side to separate base/emitter regions from each other; a third step of defining a gate region to form a metal- oxide semiconductor transistor in each of the p- and n-wells and forming collector/emitter regions in the bipolar transistor region; and a fourth step of forming an n-type metal oxide semiconductor transistor, a p-type metal oxide semiconductor transistor and a bipolar transistor on the p-well, n-well and collector/emitter regions, respectively, and forming source/drain and base electrodes through diffusion by using a doped polycrystalline silicon sidewall spacer.
申请公布号 US5693555(A) 申请公布日期 1997.12.02
申请号 US19960670756 申请日期 1996.06.21
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 KIM, KWANG-SOO;KIM, CHEON-SOO;BAEK, KYU-HA;KIM, BO-WOO
分类号 H01L21/8249;H01L27/06;(IPC1-7):H01L21/824 主分类号 H01L21/8249
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