PLASMA ION SOURCE MASS ANALYZER,申请号JP19960120627-传众专利搜索

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发明名称	PLASMA ION SOURCE MASS ANALYZER
摘要
申请公布号	JPH09306418(A)	申请公布日期	1997.11.28
申请号	JP19960120627	申请日期	1996.05.15
申请人	SEIKO INSTR INC	发明人	NAKAGAWA YOSHITOMO
分类号	G01N27/62;H01J49/04;H01J49/06;H01J49/10;H01J49/12;H01J49/42;(IPC1-7):H01J49/04	主分类号	G01N27/62
代理机构		代理人
主权项
地址

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