发明名称 MANUFACTURE OF PHASE SHIFT MASK, BLANKS FOR PHASE SHIFT MASK AND PHASE SHIFT MASK
摘要 PROBLEM TO BE SOLVED: To adjust the quantity of transmitted light of light transmitting areas different in phase of transmitted light from each other uniform by providing a transparent substrate, specified silicon nitride film and silicon oxide film, and a shielding film for covering the main surface of the transparent substrate in the shielding area. SOLUTION: A silicon nitride film 3 and a silicon oxide film 5 are formed in layers in such a manner as to a first light transmitting area Ta on a transparent substrate 1 and expose a second light transmitting area Tn. A shielding film 7 is formed in such a manner as to cover a shielding area S on the transparent substrate 1 and expose the first and second light transmitting areas Ta, Tn. In the case of using i-ray (wavelength; 365nm) as exposure light, it is preferable that the film thickness tN of the silicon nitride film 3 is 1570+47Å, and the film thickness tO of the silicon oxide film 5 is 240+108Å. The quantity (intensity) of each transmitted light can be controlled to be substantially same by thus setting the film thickness of each film 3, 5.
申请公布号 JPH09304912(A) 申请公布日期 1997.11.28
申请号 JP19960120052 申请日期 1996.05.15
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKAO SHUJI;TSUJITA KOICHIRO;KANEOKA TATSUNORI
分类号 G03F1/00;G03F1/30;G03F1/68;G03F1/80;H01L21/027 主分类号 G03F1/00
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