发明名称 TOTAL REFLECTION MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To stably measure total reflection even under environment generating a temp. change by sampling the temp. data of the sample to be measured in a sample cell within a real time to control the same in order to hold the temp. of the sample to predetermined temp. SOLUTION: A sample cell 111 is composed of a material. of high heat conductivity and has a recessed part having an inner diameter slightly larger than the outer diameter of the plane mirror of a total reflection prism. A soln. 110 to be measured is put in the recessed part to be brought into contact with a flat head surface. A hot stage 113 heats and cools the cell 111 to raise and lower the temp. of the soln. 110 to be measured in the cell 111. Herein, a detection means 115 immerses a sensing part in the soln. 110 to be measured in the cell 111 and the temp. data of the soln. 110 to be measured is detected within a real time by the sensing part. A control means 117 raises and lowers the temp. of a stage 113 and controls the temp. of the soln. 110 to be measured outputted by the detection means 115 so as to hold the same to a predetermined temp. By this constitution, stable measurement becomes possible even under environment generating a temp. change.
申请公布号 JPH09304269(A) 申请公布日期 1997.11.28
申请号 JP19960146792 申请日期 1996.05.15
申请人 JASCO CORP 发明人 JIN CHIHIRO;OOKUBO MASAHARU
分类号 G01N21/27;(IPC1-7):G01N21/27 主分类号 G01N21/27
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