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发明名称
IC-TESTING APPARATUS
摘要
申请公布号
JPH09304482(A)
申请公布日期
1997.11.28
申请号
JP19960125373
申请日期
1996.05.21
申请人
HITACHI LTD
发明人
ONISHI FUJIO;ORIHASHI RITSURO;HAYASHI YOSHIHIKO
分类号
G01R31/28;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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