发明名称 |
Semiconductor device especially MOSFET or flash EEPROM |
摘要 |
A semiconductor device has a first conductivity type semiconductor substrate (1) with a main surface containing a pair of spaced-apart impurity regions (2a, 2b, 3a, 3b) of opposite second conductivity type, a channel region formed between the impurity regions and enclosed by an insulating film (4a), and an electrode (5) formed on the insulating film. The novelty is that (a) the insulating film (4a) has uniform thickness and has nitrogen-containing end regions (4d) in contact with the pair of impurity regions; or (b) the insulating film has nitrogen-containing end regions in contact with the pair of impurity regions and, between these nitrogen-containing end regions, a region which has lower nitrogen impurity concentration and greater thickness than the end regions. Also claimed are processes for producing a semiconductor device.
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申请公布号 |
DE19642746(A1) |
申请公布日期 |
1997.11.27 |
申请号 |
DE19961042746 |
申请日期 |
1996.10.16 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP |
发明人 |
KUROI, TAKASHI, TOKIO/TOKYO, JP;SAYAMA, HIROKAZU, TOKIO/TOKYO, JP |
分类号 |
H01L21/8247;H01L21/28;H01L21/336;H01L27/115;H01L29/51;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/78;H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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