| 摘要 |
<p>A method of coin testing is provided in which a laser beam (13) is directed onto a face of a coin (4) and a laser detector (3) is used to detect where the laser beam is intercepted by the coin and where the laser beam is not intercepted by the coin, so as to obtain an indication of a characteristic of the face of the coin. The characteristic of the coin is used to identify the coin. The invention also relates to an apparatus for coin testing, which comprises a laser source (11) to direct a laser beam (13) onto a face of a coin (4), a laser detector (3) for detecting where the laser is intercepted by the coin and where the laser is not intercepted by the coin, and a signal-processor (14) which obtains an indication, from an output of the laser detector (3), of a characteristic of the face of the coin which is used to identify the coin.</p> |
