发明名称 Sensor for measuring ion concentrations
摘要 Sensor comprises a lifting arm (10 provided with a measuring point (2), the arm movement being detected by scanning the surface of a sample (9) arranged on a conducting base (8) forming a measuring electrode provided on one side with a conducting layer (30 forming a second measuring electrode. An ion-selective layer (5,6) is applied to semiconductor layer (4) on the measuring point (2).
申请公布号 DE19636582(C1) 申请公布日期 1997.11.27
申请号 DE1996136582 申请日期 1996.09.09
申请人 FORSCHUNGSZENTRUM JUELICH GMBH, 52428 JUELICH, DE 发明人 SCHOENING, MICHAEL JOSEF, DR.-ING., 52428 JUELICH, DE;JUMPERTZ, REINER, DIPL.-PHYS., 52428 JUELICH, DE;MANTL, SIEGFRIED, DR.RER.NAT., 52428 JUELICH, DE;KORDOS, PETER, PROF. DR., 52428 JUELICH, DE;LUETH, HANS, PROF. DR.RER.NAT., 52076 AACHEN, DE
分类号 G01B21/30;G01N13/00;G01N27/22;G01N27/416;G01Q70/16;(IPC1-7):G01N13/00 主分类号 G01B21/30
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