发明名称 |
APPARATUS AND METHOD FOR DRY ETCHING USING LIGHT AND MICROWAVE |
摘要 |
Disclosed is a dry etching apparatus using light and microwave including a plasma tube(37), a reaction chamber(33), and an investigation device(40). The plasma tube(37) inlet the gas activated by a microwave generation device to the reaction chamber in which a wafer(31) is positioned. The activated gas reacts the wafer(31) placing on a electrode(32) to which a supply voltage is applied in the reaction chamber(33). The surface of the wafer(31) is activated by vertically projecting light to the wafer(31) on the upper part of the chamber(33). Thereby, the investigation device(40) helps to react radical input into the chamber(33) through the plasma tube(37).
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申请公布号 |
KR0124512(B1) |
申请公布日期 |
1997.11.26 |
申请号 |
KR19930030852 |
申请日期 |
1993.12.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
LEE, BYUNG-SUK;KIM, DONG-SUK;KIM, KYUNG-JIN |
分类号 |
G03F7/26;(IPC1-7):G03F7/26 |
主分类号 |
G03F7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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