发明名称 APPARATUS AND METHOD FOR DRY ETCHING USING LIGHT AND MICROWAVE
摘要 Disclosed is a dry etching apparatus using light and microwave including a plasma tube(37), a reaction chamber(33), and an investigation device(40). The plasma tube(37) inlet the gas activated by a microwave generation device to the reaction chamber in which a wafer(31) is positioned. The activated gas reacts the wafer(31) placing on a electrode(32) to which a supply voltage is applied in the reaction chamber(33). The surface of the wafer(31) is activated by vertically projecting light to the wafer(31) on the upper part of the chamber(33). Thereby, the investigation device(40) helps to react radical input into the chamber(33) through the plasma tube(37).
申请公布号 KR0124512(B1) 申请公布日期 1997.11.26
申请号 KR19930030852 申请日期 1993.12.29
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 LEE, BYUNG-SUK;KIM, DONG-SUK;KIM, KYUNG-JIN
分类号 G03F7/26;(IPC1-7):G03F7/26 主分类号 G03F7/26
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