发明名称 PHOTO-MASK AND FABRICATION METHOD
摘要 A photo mask and method for fabricating the same is disclosed. The photo mask and method for fabricating the same comprises a mask substrate(301) for transmitting light, a chrome film(302) for protecting transmission of light, wherein the chrome film is formed on one side of the mask substrate(301). A high reflection film(304) having high reflection ratio, wherein the high reflection film(304) is formed to overlap with the chrome film(302). Thereby, reliability and yield of the semiconductor device is significantly improved by securing enough margin of lithography processing.
申请公布号 KR0123241(B1) 申请公布日期 1997.11.26
申请号 KR19940007614 申请日期 1994.04.12
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 HAM, YOUNG-MOK
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
代理机构 代理人
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