发明名称 Plasma processing apparatus and processing method
摘要 <p>A plasma processing apparatus has a substrate holder, arranged in a reaction vessel which can be reduced in pressure, for placing a substrate to be processed thereon, means for feeding a process gas into the reaction vessel, and a cathode electrode for supplying a high-frequency wave power from a high-frequency wave power source to an interior of the reaction vessel through a matching circuit, and is characterized in that at least a part of the reaction vessel is constituted by a dielectric member, and the cathode electrode is arranged outside the reaction vessel, so that a plasma distribution in the reaction vessel is made uniform, and a uniform plasma process for a substrate to be processed is made possible. The plasma process includes CVD, sputtering, etching or ashing. <IMAGE></p>
申请公布号 EP0808918(A2) 申请公布日期 1997.11.26
申请号 EP19970303434 申请日期 1997.05.20
申请人 CANON KABUSHIKI KAISHA 发明人 TERANISHI, KOJI;YAMAGAMI, ATSUSHI;TAKAKI, SATOSHI
分类号 H05H1/46;C23C14/34;C23C16/50;C23C16/505;C23C16/507;C23F4/00;H01J37/32;H01L21/203;H01L21/205;H01L21/302;H01L21/3065;H01L21/31;H01L31/20;(IPC1-7):C23C16/50;C23C14/40 主分类号 H05H1/46
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